D.M. Cox, B.M. Disko, S.M. Gorun, M. Greaney, et al., "Characterization of C60 and C70 clusters," Journal of the American Chemical Society, 113:2940-44, 1991.
David Cox (Exxon Research and Engineering Co., Annandale, N.J.): "Upon learning of the Kratschmer and Huffman technique (Nature, 347:354, 1990) for producing fullerenes in September 1990, we quickly were able to produce sufficient quantities (several milligrams at that time was a lot) to allow us to study the molecular properties of these novel molecules.
"In this paper, we pulled together in one place a series of critical measurements that now allows anyone with the appropriate equipment to separate and positively identify C60 and C70, the two most abundant fullerenes produced in the carbon arc process. We showed that thermal desorption negative ion chemical ionization mass spectrometry was and is one of the most sensitive techniques for detection of bare (underivatized) fullerenes. The question of whether only ...
