Deeper Insights into Material Properties with the In situ Lab for ZEISS Field Emission Scanning Electron Microscopes

ZEISS introduces an integrated solution for multi-modal in situ experiments |  Automated in situ workflows for highly reproducible, precise, and reliable operator-independent data collection | High-throughput data acquisition with high-resolution creating statistically representative results | High-quality data for reliable post-processing, such as strain mapping using digital imaging correlation (DIC), powered by GOM |  Easy data management

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Today, ZEISS is introducing its new integrated in situ workflow for ZEISS field emission scanning electron microscopes (FE-SEM). When researchers need to link material performance to microstructure, which is essential for developing novel materials in a highly efficient way, they can now extend their ZEISS FE-SEM with an in situ solution for heating and tensile experiments. This allows them to observe materials like metals, alloys, polymers, plastics, composites, and ceramics under heat and tension automatically while plotting stress-strain curves on the fly. They can control all system components from a single PC with a unified software environment that enables unattended automated materials testing for up to 24 hours. Core imaging facilities and materials research labs in academia, government and industry will equally benefit from this new solution.

Gaining deeper insights into material properties

In situ materials testing in the SEM delivers precise measurement of the dynamic response of microstructures to ...

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