Bruker (NASDAQ: BRKR) today announced the release of Inspire™, the first integrated scanning probe microscopy (SPM) infrared system for 10-nanometer spatial resolution in chemical and materials property mapping. The new and unique Inspire system incorporates Bruker’s proprietary PeakForce IR™ mode to enable nanoscale infrared reflection and absorption mapping for a wide range of applications, including the characterization of microphases and their interfaces in polymer blends, plasmons in the two-dimensional electron gas of graphene, and chemical heterogeneity in complex materials and thin films.
The Inspire system features sensitivity down to molecular monolayers, even on samples not amenable to standard atomic force microscopy techniques. Inspire utilizes fully integrated infrared scattering, scanning near-field optical microscope (SNOM) optics, point-and-click alignment, and the full suite of exclusive PeakForce Tapping® technologies found on Bruker’s performance-leading AFMs, from ScanAsyst® self-optimization to quantitative PeakForce QNM® nanomechanics and PeakForce KPFM™ work function measurements. The resulting Inspire solution now provides ...
