Materials scientists can now gain valuable insight into the relationships between a material’s structure at the microscopic level and its bulk properties using a new multi-scale imaging solution that is designed to provide large-scale, high-fidelity three-dimensional (3D) images of the sample. The new HeliScan MicroCT Imaging System will be presented at MRS, November 27-December 2, 2016 in Boston, Mass., FEI Booth # 701.
HeliScan is a critical component of a multi-scale, multi-modal workflow, which begins with a MicroCT scan using HeliScan and progresses through higher-resolution imaging with, for example, a Helios plasma-focused ion beam (PFIB) DualBeam, to atomic-scale analysis in a transmission electron microscope (TEM), such as a Titan system. When combined, these technologies provide a better understanding of a material’s composition.
“Unlike a conventional circular scan, the helical scan is designed to enable fast, artifact-free imaging, even on historically challenging high-aspect ratio samples,” said Trisha Rice, vice president and ...
